Secure Enrollment for Physical Unclonable Functions (PUFs)

Description

The technology provides test methods that enhance security during physical unclonable function (PUF) enrollment cycles and subsequent authentication cycles. With this technology, generic built-in logic and memory self-test (BIST) methods are combined to speed up the PUF enrollment operations. Acting as a test controller, an enrollment controller (test fixture) is added to the system to manage security. The test fixture manages an on-chip generator to create PUF challenges and uses scan test methods to output the associated response value. The data is then encrypted before transmission in such a way that only authorized parties can access the information. The same test fixture is used, on-demand, to generate fresh responses that authenticate the devices in support of various cryptographic protocols.

Additional information

Patent number and inventor

16/900,675

Bertrand Cambou and David Hely

Potential applications

This technology is designed for use with cryptographic systems and authentication methods.

Benefits and advantages

PUF testing needs to be long enough to acquire enough data securely and economically. This technology inserts a secure test fixture as part of the PUF. In turn, the data being scanned is secured and cannot easily be exploited without a secret key. As a result, the enrollment data cannot be utilized by a non-authorized user. This invention enables the commercialization of economical PUFs, which have high commercial value.

Case number and licensing status

2019-045

This invention is available for licensing.