Secure Enrollment for Physical Unclonable Functions (PUFs)

Description

The technology provides test methods that enhance security during physical unclonable function (PUF) enrollment cycles and subsequent authentication cycles. With this technology, generic built-in logic and memory self-test (BIST) methods are combined to speed up the PUF enrollment operations. Acting as a test controller, an enrollment controller (test fixture) is added to the system to manage security. The test fixture manages an on-chip generator to create PUF challenges and uses scan test methods to output the associated response value. The data is then encrypted before transmission in such a way that only authorized parties can access the information. The same test fixture is used, on-demand, to generate fresh responses that authenticate the devices in support of various cryptographic protocols.

Additional information