- TEM Lab
Transmission Electron Microscope Training
Coming this July, NAU will offer this training workshop for Talos F200i, which is a transmission electron microscope (TEM) manufactured by FEI, a subsidiary of Thermo Fisher Scientific. The Talos F200i is a high-performance TEM that is designed for a range of applications, including materials science, biology, and nanotechnology.
The Talos F200i features a number of advanced capabilities, including high-resolution imaging, energy-dispersive X-ray spectroscopy (EDS), and electron energy-loss spectroscopy (EELS). These capabilities allow researchers to study the structure and composition of materials at the nanoscale with high precision and accuracy.
In addition, the Talos F200i has a large chamber, which provides a stable and flexible environment for samples, and a number of user-friendly features, such as an intuitive interface and automated data processing, that make it easy for users to obtain high-quality data.
Overall, the Talos F200i is a highly advanced TEM that is well suited for a range of research and development applications in the materials science, biology, and nanotechnology fields. The training workshop will issue a certificate for those who successfully complete the training.
Meet the Instructors
Dr. Jose Yacaman’s research is very broad and has made contributions in several fields of Physics, Materials science and Nanotechnology. One of the focuses of his research has been the correlation of structure and properties in nanomaterials. He has developed electron microscope methods to study nanoparticles and 2-D materials. He has published more than 550 papers in peer review journals. During his career he supervised around 100 graduate students and Postdoctoral fellows. His present interest is to develop the nanoscale equivalent of High Entropy Alloys and to develop new catalysts to produce cleaner fuels.
Please visit Prof. Yacaman’s ¡MIRA! website for more detailed information on his research interests.
Dr. Domingo I. Garcia-Gutierrez is the coordinator of the Electron Microscopy Laboratory in the Centre for Innovation, Research and Development in Engineering and Technology (CIIDIT for its Spanish acronym), also a professor in the graduate program in Materials Science and Engineering at the Mechanical and Electrical Engineering School in the Universidad Autónoma de Nuevo León (UANL). Before joining UANL, Domingo was in charge of the TEM group in SVTC Technologies, previously ATDF-SEMATECH (Austin, Texas), where he worked on the development of TEM based characterization techniques for semiconductor materials, particularly for “beyond CMOS” applications; in the development of metrology techniques for semiconductor nanostructures and contributed to the advancement of calibration methodologies for “critical dimensions” measurement equipment for the semiconductor industry. His group has developed and refined the use of several advanced TEM and STEM based diffraction and spectroscopy techniques for the structural and optoelectronic characterization of semiconductor nanostructures