References

Books and Technical Manuals

  • Adler, I., 1966, X-ray Emission Spectrography in Geology, Elsevier, 258 pp.
  • Anderson, C. A., ed., 1973, Microprobe Analysis, John Wiley & Sons, 571 pp.
  • Beaman, D. R. & Isasi,  J. A., 1972, Electron Beam Microanalysis, ASTM, Special Technical Publication 506, 79 pp.
  • Bertin, E. P., 1978, Introduction to X-ray Spectrometric Analysis, Plenum Press, 485 pp.
  • Birks, L. S., 1971, Electron Probe Microanalysis, 2nd ed., Wiley Interscience, 190 pp.
  • Goldstein J. I. & Yakowitz H., eds., 1975, Practical Scanning Electron Microscopy, Plenum Press, 582 pp.
  • Goldstein JI, Newbury DE, Echlin P, Joy DC, Fiori C & Lifshin E, 1981, Scanning Electron Microscopy and X-ray Microanalysis, Plenum Press, 673 pp.
  • Goldstein, J. I., Newbury, D. E., Joy, D. C., Lyman, C. E., Echlin, P., Lifshin, E., Sawyer, L. & Michael, J. R. 2003, Scanning Electron Microscopy and X-ray Microanalysis, 3rd ed, Springer, 690 pp.
  • Kevex Corporation, 1983, Energy Dispersive X-Ray Microanalysis: An Introduction, 52 pp.
  • Heinrich, K. F. J., 1967, Quantitative Electron Probe Microanalysis, NBS Special Publication 298, 299 pp.Van Nostrand Reinhold Co., 578 pp.
  • Heinrich, K. F. J., 1981, Electron Beam X-ray Microanalysis, Van Nostrand Reinhold Co., 578 pp.
  • Heinrich, K. F. J. & Newbury, D. E., 1991, Electron Probe Quantification, Plenum Press, 400 pp.
  • Heinrich, K. F. J., Newbury, D. E., Myklebust, R. L. & Fiori, C. E., 1981, Energy Dispersive X-ray Spectrometry, NBS Special Publication 604, 444 pp.
  • Jenkins, R. & DeVries, J. L., 1982, Practical X-ray Spectrometry, 2nd ed., Springer-Verlag, 188 pp.
  • Liebhafsky, H. A., Pfeiffer, H. G., Winslow, E. H. & Zemany, P. D., 1972, X-rays, Electrons and Analytical Chemistry, John Wiley & Sons, 566 pp.
  • Marshall, D. J., 1988, Cathodoluminescence of Geological Materials, Unwin Hyman, 146 pp.
  • Maurice, F., Meny, L. & Tixier, R., eds., 1980, Microanalysis and Scanning Electron Microscopy, Summer School, Les Editions de Physique, 530 pp. 
  • Potts, P. J., 1987, A Handbook of Silicate Rock Analysis, Blackie, 622 pp.
  • Potts, P. J., Bowles, J. F. W., Reed, S. J. B. & Cave, M. R., 1995, Microprobe Techniques in the Earth Sciences, Chapman & Hall, 419 pp.
  • Reed, S. J. B., 1993, Electron Microprobe Analysis, 2nd ed., Cambridge, 326 pp.
  • Reed, S. J. B., 2005, Electron Microprobe Analysis and Scanning Electron Microscopy in Geology, Cambridge, 189 pp.
  • Rouessac, F. & Rouessac, A., 1998, Chemical Analysis: Modern Instrumentation Methods and Techniques, Wiley, 445 pp.
  • Severin, K. P., 2004, Energy Dispersive Spectrometry of Common rock Forming Minerals, Kluwer Academic Pub., 225 pp.
  • Till, R., 1974, Statistical Methods for the Earth Scientist, John Wiley & Sons, 154 pp.
  • Welton, J. E., 1984, SEM Petrology Atlas, American Association of Petroleum Geologists.
  • Wenk, H.-R., ed., 1976, Electron Microscopy in Mineralogy, Springer-Verlag, 564 pp.
  • Williams, K. L., 1987, Introduction to X-ray Spectrometry, Allen & Unwin, 370 pp.

Articles

  • Albee AA & Chodos A, 1970, Semiquantitative electron microprobe determination of Fe2+/Fe3+ and Mn2+/Mn3+ in oxides and silicates and its application to petrologic problems: American Mineralogist 55:491-501.
  • Albee AL & Ray L, 1970, Correction factors for electron probe microanalysis of silicates, oxides, carbonates, phosphates and sulfates: Analytical Chemistry 42:1408-1414.
  • Anderson IM, Carter CB & Bentley J, 1995, The secondary characteristic fluorescence correction in the EPMA, Microbeam Analysis (MAS Proceedings), 213-214.
  • Anderson IM, Bentley J & Carter CB, 1995, The secondary fluorescence correction for X-ray microanalysis in the analytical electron microscope: Journal of Microscopy 178:226-239.
  • Anderson IM, Bentley J & Carter CB, 1997, Secondary fluorescence correction formulae for X-ray microanalysis - I. Parallel-sided thin foil, wedge, and bulk specimens: Ultramicroscopy 68:77-94.
  • Anderson IM, Bentley J & Carter CB, 1997, Secondary fluorescence correction formulae for X-ray microanalysis - II. Self-supporting discs: Ultramicroscopy 68:95-107.
  • Armstrong JT, 1988, Quantitative analysis of silicate and oxide materials: comparison of Monte Carlo, ZAF, and f(rZ) procedures, in Newbury DE, ed., Microbeam Analysis:239-246.
  • Armstrong JT, 1988, Bence-Albee after 20 years: review of the accuracy of a-factor correction procedures for oxide and silicate minerals, in Newbury DE, ed., Microbeam Analysis:469-476.
  • Armstrong JT, 1988, Accurate quantitative analysis of oxygen and nitrogen with a W/Si multilayer crystal, in Newbury DE, ed., Microbeam Analysis, 301-304.
  • Armstrong JT, 1993, Effects of carbon coat thickness and contamination on quantitative analysis: a new look at an old problem: Proceedings of the 27th Annual MAS Meeting, S13-14.
  • Bastin GF & Heijligers HJM, 1991, Quantitative electron probe microanalysis of ultra-light elements (boron - oxygen), in Heinrich KFJ & Newbury DE, eds., Electron Probe Quantitation, Plenum Press, NY, 145-161.
  • Bastin GF & Heijligers HJM, 1992, Present and future of light element analysis with electron beam instruments: Microbeam Analysis 1:61-73.
  • Bastin GF & Heijligers HJM, 1992, Quantitative epma of nitrogen: a tricky element in the electron-probe microanalysis: Proceeding of 50th Annual Meeting of Electron Microscopy Society of America, 1622-1623.
  • Bastin GF & Heijligers HJM, 1991, Nonconductive specimens in the electron probe microanalyzer - a hitherto poorly discussed problem, in Heinrich KFJ & Newbury DE, eds., Electron Probe Quantitation, Plenum Press, NY, 163-175.
  • Bayard M, 1973, Applications of the electron microprobe to the analysis of free particulates, in Anderson CA, ed., Microprobe Analysis, Wiley, 323-348.
  • Bence AE & Albee AL, 1968, Empirical correction factors for the electron microanalysis of silicates and oxides: Journal of Geology 76:382.
  • Bustin, R. Marc, M. Mastalerz & K. Wilks, 1993, Direct determination of carbon, oxygen and nitrogen content in coal using the electron microprobe: Fuel 72:181-185.
  • Dalton JA & Lane SA, 1996, Electron microprobe analysis of Ca in olivine close to grain boundaries: The problem of secondary X-ray fluorescence: American Mineralogist 81:194-201.
  • Devine JD, Gardner JE, Brack HP, Layne GD & Rutherford MJ, 1995, Comparison of microanalytical methods for estimating H2O contents of silicic volcanic glasses: American Mineralogist 80:319-328.
  • Donovan JJ, Snyder DA & River ML, 1993, An improved interference correction for trace element analysis:Microbeam Analysis 2:23-28.
  • Echlin P, 1978, Coating techniques for scanning electron microscopy and x-ray microanalysis: SEM 19781:109-132.
  • Fialin M & Remond G, 1992, Problems with oxygen analysis in the system MgO-Al2O3-SiO2 with the electron microprobe: Proceeding of 50th Annual Meeting of Electron Microscopy Society of America, 1624-25.
  • Fialin M & Remond G, 1993, Electron probe microanalysis of oxygen in strongly insulating oxides:Microbeam Analysis 2:179-189.
  • Finger LW, 1971, Determination of dead-time in X-ray detector systems: Geophysical Laboratory Yearbook '70, 275.
  • Fleet ME & Mumin AH, 1997, Gold-bearing arsenian pyrite and marcasite and aresenopyrite from Carlin Trend gold deposits and laboratory synthesis: American Mineralogist 82:182-193.
  • Ganguly J, Bhatacharya RN & Chakraborty S, 1988, Convolution effect in the determination of compositional profiles and diffusion coefficients by microprobe step scans: American Mineralogist 73:901-909.
  • Ganguly J, Chakraborty S, Sharp TG & Rumble D, 1996, Constraint on the time scale of biotite-grade metamorphism during Acadian orogeny from a natural garnet-garnet diffusion couple: American Mineralogist 81:1208-1216.
  • Goldstein JJ, Choi SK, van Loo FJJ, Heijliger HJM, Dijkstra JM & Bastin GF, 1991, The influence of surface oxygen contamination of bulk empa of oxygen in ternary titanium-oxygen-compounds: in Howitt DG, ed., Microbeam Analysis, 57-58.
  • Gupta, BL, 1991, Ted Hall and the science of biological microprobe x-ray analysis: Scanning Microscopy5:379-426.
  • Hanchar JM & Rudnick RL, 1995, Revealing hidden structures: the application of cathodoluminescence and back-scattered electron imaging to dating zircons from lower crustal xenoliths: Lithos 35:289-303.
  • Howie RA & Smith JV, 1966, X-ray emission microanalysis of rock-forming minerals V. Orthopyroxenes:Journal of Geology 74:443-462.
  • Kanaya, K. & Okayama, S, 1972, J. Phys. D. Appl. Phys. 5:43.
  • Kane WT, 1973, Applications of the electron microprobe in ceramics and glass technology: in Anderson CA, ed., Microprobe Analysis, Wiley, 241-270
  • Keil K, 1967, The electron microprobe x-ray analyzer and its application in mineralogy: Fortschr. Miner.44:4-66.
  • Keil K, 1973, Applications of the electron microprobe in geology: in Anderson, C.A., ed., Microprobe Analysis, Wiley, 189-239.
  • Kerrick DM, Eminhizer LB & Villaume JF, 1973, The role of carbon film thickness in electron microprobe analysis: American Mineralogist 58:920-925.
  • Kniseley RN & Laabs FC, 1973, Applications of cathodoluminescence in electron microprobe analysis: inAnderson CA, ed., Microprobe Analysis, Wiley, 371-382.
  • Knowles CR, Smith JV, Bence AE & Albee AL, 1968, X-ray emission microanalysis of rock-forming minerals VII. Garnets: Journal og Geology 77:439-451.
  • Lane SJ & Dalton JA, 1994, Electron microprobe analysis of geological carbonates: American Mineralogist 79:745-749.
  • Le Maitre RW, 1982, Numerical Petrology, Elsevier, 260 pp.
  • Lechene CP & Warner RR, 1977, Ultramicroanalysis: X-ray spectrometry by electron probe excitation:Annual Review of Biophysics and Bioengineering. 6:57-85.
  • Long JVP, 1976, Electron probe microanalysis: in Zussman J, ed., Physical Methods in Determinative Mineralogy, Academic Press, 215-260.
  • Long JVP & Agrell SO, 1965, The cathodoluminescence of minerals in thin section: Mineralogical Magazine 34 (Tilley Vol), 318-326.
  • Love G & Scott VD, 1978, J. Phys. D 11: 1369.
  • Marinenko RB, 1991, Standards for Electron Probe Microanalysis: in Heinrich KFJ & Newbury DE, eds.,Electron Probe Quantitation, Plenum, 251-260.
  • Mastalerz M & Bustin RM, 1993, Variation in elemental composition of macerals: An example of the application of electron microprobe to coal studies: International Journal of Coal Geology 22:83-89.
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  • Maurice F, Meny L & Tixier R, eds., 1979, Microanalysis and Scanning Electron Microscopy, Les Editions de Physique, 530 pp.
  • McGuire AV, Francis CA, & Dyar MD, 1992, Mineral standards for electron microprobe analysis of oxygen, American Mineralogist, 77, 1087-1091.
  • McKinley TD, Heinrich KFJ & Wittry DB, 1966, The Electron Microprobe, John Wiley & Sons, 1030 pp.
  • Morgan GB & London D, 1996, Optimizing the electron microprobe of hydrous alkali aluminosilicate glasses, American Mineralogist, 81, 1176-1185.
  • Muller RO, 1972, Spectrochemical Analysis by X-ray Fluorescence, Plenum Press, 326 pp.
  • Nielsen, C.H. and Sigurdsson, H, 1981, Quantitative methods for electron microprobe analysis of sodium in natural and synthetic glasses, American Mineralogist, 66, 547-552.
  • Norrish K & Chappell BW, 1976, X-ray fluorescence spectrography: in Zussman, J (ed.), Physical Methods in Determinative Mineralogy, Academic Press, p. 215-260.
  • O'nions RK & Smith DGW, 1971, Investigations of the I, II, III x-ray emission spectra of Fe by electron microprobe, Part 2: The Fe I, II, III spectra of Fe and Fe-Ti oxides: American Mineralogist 56:1452-1463.
  • Piccoli P & Candela, P, 1994, Apatite in felsic rocks: a model for the estimation of initial halogen concentrations in the Bishop Tuff and Tuolumne instrusive suite magmas: American Journal of Science294:92-135.
  • Pouchou JL & Pichoir F, 1984, A new model for quatitative X-ray microanalysis, Part II: Application to in-depth analysis of heterogeneous samples: Recherche Aerospatiale 1984-5:47-65.
  • Pouchou JL & Pichoir F, 1985, "PAP" f(rZ) procedure for improved quantitative microanalysis: inArmstrong, JT, ed., Microbeam Analysis 1985, 104-106.
  • Ramsden, Anthony R. and French, David H, 1990, Routine trace-element capabilities of electron microprobe analysis in mineralogical investigations: an empirical evaluation of performance using spectrochemical standard glasses. Canadian Mineralogist28, 171- 180.
  • Raudsepp, M, 1995, Recent advances in the electron-probe micro- analysis of minerals for the light elemetns. Canadian Mineralogist, 33, 203-218
  • RCA Corporation, 1974, Electro-Optics Handbook, 255 pp.
  • Reed SJB, 1993, Electron Microprobe Analysis, 2nd edition, Cambridge University Press, 326 pp.
  • Reed, SJB, 1996, Electron Microprobe Analysis and Scanning Electron Microscopy in Geology, Cambridge University Press. Ribbe, PH & Smith, JV, 1966, X-ray emission microanalysis of rock-forming minerals IV. Plagioclase feldspars, J. Geol., 74, 217-233.
  • Roeder, P, 1985, Electron-microprobe analysis of minerals for rare- earth elements: use of calculated peak-overlap corrections, Canadian Mineralogist, 23, 263-271.
  • Rucklidge JC, Gasparrini E, Smith JV & Knowles CR, 1971, X- ray emission microanalysis of rock-forming minerals VIII. Amphiboles: Canadian Journal of Earth Science 8, 1171-1183
  • Russ JC, 1984, Fundamentals of Energy Dispersive X-ray Analysis, Butterworths, 308 pp.
  • Sippel, R.F. and Glover, ED, 1965, Structures in carbonate rocks made visible by luminescence petrography, Science, 150, 1283-1287.
  • Smith DGW, 1976, Short Course in Microbeam Techniques, Mineralogical Association of Canada, 183 pp.
  • Smith, D.G.W. and O'nions, R.K, 1971, Investigations of the I, II, III x-ray emission spectra of Fe by electron microprobe, Part 1: Some aspects of the Fe I, II, III spectra from metallic iron and hematite, Brit. J. Appl. Physics, 4, 147-159.
  • Smith, D.G.W. and O'nions, R.K, 1972, Investigations of bonding in some oxide minerals by oxygen K emission spectroscopy, Chem. Geol., 9, 29-43 and 145-146.
  • Smith, J.V, 1965, X-ray emission microanalysis of rock-forming minerals I. Experimental techniques, J. Geol., 73, 830-864.
  • Smith JV, 1966, X-ray emission microanalysis of rock-forming minerals VI. Clinopyroxenes near the diopside-hedenbergite join, J. Geol., 74, 463-477.
  • Smith JV, 1966, X-ray emission microanalysis of rock-forming minerals II. Olivines: Journal of Geology74, 1-16.
  • Smith JV & Ribbe PH, 1966, X-ray emission microanalysis of rock-forming minerals III. Alkali feldspars:Journal of Geology 74, 197-216.
  • Smith JV & Stenstrom RC,1965, Electron-excited luminescence as a petrologic tool, Journal of Geology73, 627-635.
  • Snetsinger KG, Bunch TE & Keil K, 1968, Electron microprobe analysis of vanadium in the presence of titanium: American Mineralogist 53, 1770-1773
  • Spray, J. G. and Rae, D. A. (1995) Quantitative electron-microprobe analysis of alkali silicate glasses: a review and user guide. Canadian Min., 33, 323-332.
  • Steele, IM, 1991, Digitized cathodoluminescence imaging of minerals, Scanning Microscopy 5: 611-618.
  • Stormer, John C. Jr., Pierson, Milton L. and Tacker, Robert C, 1993, Variation of F and Cl X-ray intensity due to anisotropic diffusion in apatite during electron microprobe analysis: American Mineralogist 78: 641-648.
  • Stormer, John C. Jr., and Pierson, Milton L, 1995, Variation of F and Cl X-ray intensity and electron microprobe analysis of apatite: An addendum, Unpublished manuscript (3 pages)
  • Sweatman TR & Long, JVP, 1969, Quantitative electron-probe microanalysis of rock-forming minerals:Journal of Petrology 10: 332-379, (note: correction to one equation appeared later)
  • Sweatman TR & Long JVP, 1969, Quantitative electron-probe microanalysis of rock-forming minerals:Journal of Petrology 19: 2, 332.
  • Vassamillet, L.F. and Caldwell, V.E. (1969) Electron-probe microanalysis of alkali metals in glasses", J. Applied Physics, 40, 1637-1643.
  • Walker and Howitt (1989) Field induced migration of sodium in soda-silicate glasses during scanning electron microscopy: Scanning 11: 5-11.
  • White EW, 1973, Applications of soft x-ray spectroscopy to chemical bonding studies with the electron microprobe, in Anderson CA, ed., Microprobe Analysis, Wiley, 349-369.
  • Willich, P, 1992, EPMA of submicron coatings containing ultralight elements, in Proceeding of 50th Annual Meeting of Electron Microscopy Society of America (Bailey, Bentley and Small, Eds), p 1628-29 (H2 Jet)
  • Wittry, DB, 1973, Applications of the electron microprobe to solid- state electronics, in  Anderson, C.A., ed., Microprobe Analysis, Wiley, 123-187
  • Ziebold TO, 1967, Precision and sensitivity in electron microprobe analysis: Analytical Chemistry 39: 858.
  • Ziebold TO & Ogilvie RE, 1963, Quantative analysis with the electron microanalyzer: Analytical Chemistry35: 621-627.
  • Ziebold TO & Ogilvie RE, 1964, An empirical method for electron microanalyis: Analytical Chemistry 36: 322-327.